Dekodovanje kodova sa malom gustinom provera parnosti u prisustvu grešaka u logičkim kolima
Author
Brkić, Srđan
Mentor
Ivaniš, Predrag N.
Committee members
Smiljanić, AleksandraVasić, Bane
Saranovac, Lazar

Đorđević, Goran
Metadata
Show full item recordAbstract
Sve ve´ca integracija poluprovodniˇckih tehnologija, varijacije nastale usled nesavršenosti procesa
proizvodnje, kao zahtevi za smanjenjem napona napajanja cˇine elektronske ured¯aje inherentno
nepouzdanim. Agresivno skaliranje napona smanjuje otpornost na šum i dovodi do nepouzdanog
rada ured¯aja. Široko je prihvac´ena paradigma prema kojoj se naredne generacije digitalnih
elektronskih ured¯aja moraju opremiti logikom za korekciju hardverskih grešaka...
Due to huge density integration increase, lower supply voltages, and variations in technological
process, complementary metal-oxide-semiconductor (CMOS) and emerging nanoelectronic devices
are inherently unreliable. Moreover, the demands for energy efficiency require reduction
of energy consumption by several orders of magnitude, which can be done only by aggressive
supply voltage scaling. Consequently, the signal levels are much lower and closer to the noise
level, which reduces the component noise immunity and leads to unreliable behavior. It is
widely accepted that future generations of circuits and systems must be designed to deal with
unreliable components...