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SPM characterization of materals and its improvements by probe defects analysis

dc.contributor.advisorMatija, Lidija
dc.contributor.otherVasić, Aleksandra
dc.contributor.otherSedmak, Aleksandar
dc.contributor.otherLazović, Goran
dc.contributor.otherStamenković, Dragomir
dc.creatorPetrov, Ljubiša
dc.date.accessioned2019-12-31T10:03:53Z
dc.date.available2019-12-31T10:03:53Z
dc.date.available2020-07-03T08:44:34Z
dc.date.issued2019-02-20
dc.identifier.urihttp://eteze.bg.ac.rs/application/showtheses?thesesId=7065
dc.identifier.urihttps://nardus.mpn.gov.rs/handle/123456789/11735
dc.identifier.urihttps://fedorabg.bg.ac.rs/fedora/get/o:20693/bdef:Content/download
dc.identifier.urihttp://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=515006371
dc.description.abstractJedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala je mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd, i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a su samo aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena se zasniva na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za “slepu rekonstrukciju” vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde se izračunava iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman.sr
dc.description.abstractOne of the most perspective available technique for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The advantage of the method is that they have no restrictions related to origin and composition of the material, and its possibilities to investigate vide variety of materials. This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. However, images obtained by AFM represent only approximation of the sample surfaces. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip.en
dc.formatapplication/pdf
dc.languagesr
dc.publisherУниверзитет у Београду, Машински факултетsr
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/41006/RS//
dc.rightsopenAccessen
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.sourceУниверзитет у Београдуsr
dc.subjectKarakterizacijasr
dc.subjectCharacterizationen
dc.subjectmaterijalisr
dc.subjectSPMsr
dc.subjectAFMsr
dc.subjectsondesr
dc.subjectartefaktisr
dc.subjectkonvolucijasr
dc.subjectpostprocesuiranjesr
dc.subjectemulacijasr
dc.subjectmaterialsen
dc.subjectSPMen
dc.subjectAFMen
dc.subjectprobesen
dc.subjectartefactsen
dc.subjectconvolutionen
dc.subjectpostprocessingen
dc.subjectemulationen
dc.subjectreconstructionen
dc.titleKarakterizacija materijala SPM tehnikom i njeno unapređenje primenom analize uticaja defekata sondisr
dc.title.alternativeSPM characterization of materals and its improvements by probe defects analysisen
dc.typedoctoralThesisen
dc.rights.licenseBY-NC-ND
dc.identifier.fulltexthttp://nardus.mpn.gov.rs/bitstream/id/8029/Disertacija.pdf
dc.identifier.fulltexthttp://nardus.mpn.gov.rs/bitstream/id/8030/IzvestajKomisije21578.pdf
dc.identifier.fulltexthttps://nardus.mpn.gov.rs/bitstream/id/8029/Disertacija.pdf
dc.identifier.fulltexthttps://nardus.mpn.gov.rs/bitstream/id/8030/IzvestajKomisije21578.pdf
dc.identifier.rcubhttps://hdl.handle.net/21.15107/rcub_nardus_11735


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