Show simple item record

Ispitivanje optičkih osobina grafena pomoću spektroskopske elipsometrije

dc.contributor.advisorGajić, Radoš
dc.contributor.otherMilošević, Ivanka
dc.contributor.otherBelča, Ivan
dc.contributor.otherRadović, Zoran
dc.creatorMatković, Aleksandar V.
dc.date.accessioned2016-07-16T13:15:11Z
dc.date.available2016-07-16T13:15:11Z
dc.date.available2020-07-03T09:50:20Z
dc.date.issued2015-06-12
dc.identifier.urihttp://eteze.bg.ac.rs/application/showtheses?thesesId=3166
dc.identifier.urihttp://nardus.mpn.gov.rs/handle/123456789/5909
dc.identifier.urihttps://fedorabg.bg.ac.rs/fedora/get/o:11501/bdef:Content/download
dc.identifier.urihttp://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=47558415
dc.description.abstractThe dissertation addresses the problem of retrieving the optical properties of graphene in the visible and UV ranges using ellipsometry. Additionally, it is demonstrated how changes in these properties could be related to various fabrication aspects including the transfer process and the interaction of graphene with various substrates. Besides their importance in advancing the fundamental understanding of optical properties of graphene, these results could be used for implementation of ellipsometry as a quality control in graphene-based technologies. As these technologies expand, it will be increasingly important to have tools which are able not only to detect the presence of a graphene layer but also to give information of subtle changes in the properties of these ultra thin films. Ellipsometry, due to its numerous advantages, is most definitely one of the techniques that will be employed as a quality control tool in the future mass production of graphene. In the dissertation optical properties of graphene were studied using spectroscopic ellipsometry and null spectroscopic imaging ellipsometry techniques. The studied samples were atomically thin layers of graphene synthesized by micromechanical exfoliation and chemical vapor deposition. These samples were supported by various substrates, such as silicon wafers with thin SiO2 films, transparent (sapphire) and metallic (gold) substrates. An importance of using corroborated measurements for building up an appropriate optical models has been shown as well. Optical parameters of graphene have been retrieved using a point-by-point inversion process, and afterwards parameterized by a dielectric function model. A proposed parametrization function of graphene’s complex refractive index is based on a Fano resonant profile. This model has only four fitting parameters, and their values can be easily related to the properties of the M-point exciton that causes the red shift of the prominent absorption peak in the UV. Various set of model paramv...sr
dc.description.abstractDisertacija se bavi problemom merenja optičkih osobina grafena u vidljivom i ultraljubičastom delu spektra. Takodje, u disertaciji demonstrirano je kako se promene optičkih osobina mogu povezati sa pra´cenjem procesa sinteze, transfera, kao i interakcije grafena sa supstratom. Osim značaja za fundamentalno razumevanje optičkih osobina grafena, prikazani rezultati mogu se iskoristiti za implementaciju elipsometrije kao tehnike za kontrolu kvaliteta u novim tehnologijama zasnovanim na grafenu. Sa daljim razvojem ovih tehnologija, neophodno je imati adekvantne merne tehnike koje nisu osetljive samo na prisustvo mono-atomskog sloja, već su u stanju da pouzdano detektuju fine promene u osobinama ovih ultra tankih filmova. Zbog svojih brojnih prednosti, elipsometrija je zasigurno jedna od tehnika koja će biti korišćena za kontrolu kvaliteta, kao i procesa sinteze u budu´cim tehnologijama za masovnu proizvodnju grafena. U disertaciji optičke osobine grafena su merene pomo´cu tehnika nulirajuće i spektroskopske elipsometrije. Ispitivani su uzorci monoatomskih slojeva grafena, sintetisanih pomoću mikromehaničke eksfolijacije i depozicije iz gasne faze. Takodje, istaknut je značaj korišćenja korelacionih merenja za formiranje optičkih modela i interpretaciju elipsometarskih merenja grafena. Optičke konstante grafena su dobijene pomoću matematičke inverzije, a zatim parametrizovane pomoću modela dielektrične funkcije grafena. Predloženi model kompleksnog indeksa prelamanja grafena je zasnovan na Fano rezonantnom profilu. Ovaj model ima samo četiri parametra čije se vrednosti mogu jednostavno povezati sa osobinama eksitona u M-tački, koji izaziva crveni pomeraj apsorpcionog maksimuma u ultraljubičastom delu spektra. Različiti parametri modela dielektrične funkcije su prezentovani u disertaciji. Ovi parametri opisuju različite optičke osobine grafena koje su rezultat interakcije izmedju grafena i njegove okoline, eksternih vien
dc.formatapplication/pdf
dc.languageen
dc.publisherУниверзитет у Београду, Физички факултетsr
dc.relationinfo:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/171005/RS//
dc.rightsopenAccessen
dc.sourceУниверзитет у Београдуsr
dc.subjectgraphenesr
dc.subjectgrafenen
dc.subjectoptičke osobine grafenaen
dc.subjectspektroskopska elipsometrijaen
dc.subjectoptical properties of graphenesr
dc.subjectspectroscopic ellipsometrysr
dc.titleInvestigating the optical properties of graphene with spectroscopic ellipsometrysr
dc.titleIspitivanje optičkih osobina grafena pomoću spektroskopske elipsometrijeen
dc.typedoctoralThesis
dc.rights.licenseBY
dcterms.abstractГајић, Радош; Милошевић, Иванка; Белча, Иван; Радовић, Зоран; Матковић, Aлександар В.;
dc.identifier.fulltexthttp://nardus.mpn.gov.rs/bitstream/id/24946/Disertacija3727.pdf
dc.identifier.fulltexthttp://nardus.mpn.gov.rs/bitstream/id/24947/Matkovic_Aleksandar.pdf


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record